ANANYA R. MEHRA. Holistic Resilience in Modern Embedded Architectures: Soft-Error Mitigation, Traceability, and Fault-Tolerant Design. The American Journal of Interdisciplinary Innovations and Research, [S. l.], v. 5, n. 12, p. 60–66, 2023. Disponível em: https://www.theamericanjournals.com/index.php/tajiir/article/view/6951. Acesso em: 7 mar. 2026.