Ananya R. Mehra. (2023). Holistic Resilience in Modern Embedded Architectures: Soft-Error Mitigation, Traceability, and Fault-Tolerant Design. The American Journal of Interdisciplinary Innovations and Research, 5(12), 60–66. Retrieved from https://www.theamericanjournals.com/index.php/tajiir/article/view/6951